Track defect rates across varying production lot sizes while accounting for overdispersion.
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What is a p-Chart and how are limits calculated for variable subgroup sizes?
A p-chart monitors the proportion (fraction) of nonconforming items across inspection lots. Because sample size n can vary per lot, control limits expand and contract dynamically based on binomial standard error √(p̄(1-p̄)/n_i).
UCL = Min(1, p̄ + 3√(p̄(1-p̄)/n_i)), LCL = Max(0, p̄ - 3√(p̄(1-p̄)/n_i))
2.88%
Total: 173 / 60000 Subgroups
0.0% of seriesWhen quality inspection classifies parts dichotomously as Pass or Fail, and daily production batch quantities fluctuate, the p-chart provides rigorous statistical signaling while adjusting limits for varying lot sizes.
Simplify production floor quality tracking with integer-based defective unit counts.
Statistical Process Control (SPC)Standardize defect intensity rates across differing product sizes and inspection sample quantities.
Process Capability & Measurement (MSA)Translate defect counts and multi-step process yields into standardized Six Sigma quality levels.